2019-2 (31)

Operation of nuclear industry facilities

Article Name10.26583/GNS-2019-02-10
Metrological Tests of Measuring Subsystems
AuthorsE.I. Cvetkov*1, Yu.P. Mucha**2, I.Y. Koroleva**3, A.D. Korolev**4
Address

*State Electrotechnical University (LETI), St. Petersburg, Russia, post office box 654 (Information-measuring systems and technologies, Russia, 197046, St. Petersburg, PO Box 654)

1ORCID ID: 0000-0001-8733-713X

Wos Researher ID: O-4592-2019

e-mail: er-cvetkov@mail.ru

**Volgograd State Technical University, etc. to them. Lenin, 28, (8442) Volgograd, Russia 400005

2ORCID ID: 0000-0003-0919-5732

Wos Researher ID: M-4084-2015

e-mail: muxaup@mail.ru

3ORCID ID: 0000-0002-9185-6976

Wos Researher ID: N-4037-2015

e-mail: artmd64@rambler.ru

4ORCID ID: 0000-0003-2175-2204

Wos Researher ID: G-21091-2017

e-mail: artmd64@mail.ru

AbstractDevelopment of measuring technologies creates the corresponding problems when carrying out metrological tests. In particular, the need for taking note of the used interface on properties of errors of results of measurements appears. Emergence of errors of dating is a consequence of more and more wide circulation of multipurpose measuring means generates requirement of development of the corresponding procedures of the metrological analysis, including metrological tests. Therefore, the problem of improvement of metrological tests of measuring systems in general and their subsystems is relevant. The scientific novelty consists in development of an algorithm of tests and a conclusion of the estimated ratios connected with definition of probabilistic characteristics of the corresponding errors. The practical importance consists in development of the block diagram of a test experiment. Innovative value consists in a possibility of synthesis of test techniques for certification of the measuring subsystems and measuring systems in general considering dating errors within shift errors.
Keywordsmeasuring technology, metrological tests, metrological analysis, measurement error, the error of dating, complex measuring system, measuring subsystem, probabilistic characteristic of an error, metrological reliability, flexible intelligent interface.
LanguageRussian
References
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